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DC Field | Value | Language |
---|---|---|
dc.contributor | 47264 | es_ES |
dc.coverage.spatial | G | es_ES |
dc.creator | Pech Canul, Maximo A. | - |
dc.creator | Pech Canul, Martin I. | - |
dc.creator | Echeverría, Marta | - |
dc.creator | Montoya Davila, Miguel | - |
dc.date.accessioned | 2021-06-07T16:01:53Z | - |
dc.date.available | 2021-06-07T16:01:53Z | - |
dc.date.issued | 2007-05 | - |
dc.identifier | info:eu-repo/semantics/publishedVersion | es_ES |
dc.identifier.issn | 1938-5862 | es_ES |
dc.identifier.uri | http://ricaxcan.uaz.edu.mx/jspui/handle/20.500.11845/2563 | - |
dc.description | Cyclic polarization measurements were carried out for Al-10%Si- X%Mg (X: 3%, 6% and 9.5%) alloys in borate solutions with and without additions of 50 mM NaCl. The voltammetric response exhibited some features of oxide film growth consistent with the high field conduction model. However, higher currents and distortions in the voltammetric wave shape compared to those for pure Al were ascribed to a possible incorporation of alloying elements in the oxide film, rendering it more defective, and to the strong electrochemical activity of Mg2Si particles. | es_ES |
dc.description.abstract | Cyclic polarization measurements were carried out for Al-10%Si- X%Mg (X: 3%, 6% and 9.5%) alloys in borate solutions with and without additions of 50 mM NaCl. The voltammetric response exhibited some features of oxide film growth consistent with the high field conduction model. However, higher currents and distortions in the voltammetric wave shape compared to those for pure Al were ascribed to a possible incorporation of alloying elements in the oxide film, rendering it more defective, and to the strong electrochemical activity of Mg2Si particles. | es_ES |
dc.language.iso | eng | es_ES |
dc.publisher | IOP Science | es_ES |
dc.relation | https://iopscience.iop.org/article/10.1149/1.2789257 | es_ES |
dc.relation.ispartof | 10.1149/1.2789257 | es_ES |
dc.relation.uri | generalPublic | es_ES |
dc.rights | Atribución-NoComercial-CompartirIgual 3.0 Estados Unidos de América | * |
dc.rights.uri | http://creativecommons.org/licenses/by-nc-sa/3.0/us/ | * |
dc.source | ECS Transactions, Vol. 3, No. 31 | es_ES |
dc.subject.classification | INGENIERIA Y TECNOLOGIA [7] | es_ES |
dc.subject.other | Corrosion | es_ES |
dc.subject.other | Mg Addittion | es_ES |
dc.subject.other | Al-Si-Mg Alloys | es_ES |
dc.title | Effect of Mg Alloying Addition on Dissolution Behavior of Oxide Films in Al-Si-Mg Alloys | es_ES |
dc.type | info:eu-repo/semantics/article | es_ES |
Appears in Collections: | *Documentos Académicos*-- M. en C. e Ing. de los Materiales |
Files in This Item:
File | Description | Size | Format | |
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2007_Effect of Mg Alloying Addition.pdf | Effect of Mg Alloying Addition on Dissolution Behavior of Oxide Films in Al-Si-Mg Alloys | 397,19 kB | Adobe PDF | View/Open |
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